Memory module testers can be broadly categorized into two types, hardware memory testers and softwarediagnostic programs that run in a PC environment. Hardware memory testers have more sophisticated and comprehensive test features built into the tester as compared to software diagnostic testing programs. Software diagnostic does allow for detection of possible problems when memory modules are already installed on the computer system.
Hardware testersedit
High-end automatic test equipment (ATE) Class Memory testers are used by most OEM memory chip manufacturers such as Samsung, Hyundai, Micron…etc. They are typically priced starting at one million dollars per system. This equipment must be operated by well trained semiconductor engineers. ATE Class Memory testers are built with very complex test algorithms to detect memory faults during the final stages of memory chip packaging.
Mid-range memory testers typically priced under $26,000,[1] and are commonly found in memory module manufacturing assembly houses. These testers are built to support mass volumes of memory module testing. They are also used for detecting assembly faults caused by mis-soldering and cross-cell contamination after chips are assembled onto PCB or SIMM cards. These memory testers are usually docked onto an automatic handling system for high volume production testing, thus eliminating manual intervention by an operator.
Low-end memory testers are usually relatively low cost ranging from $1000 – $3000. Their main features are portability, ease of use and relatively small size. They are typically used by the service industry especially by computer service technicians, RMA departments, memory reseller/brokers/ and wholesalers for verifying and testing memory modules that fails in PC system or before going into PC. Quality and features of this range of memory testers varies greatly depending on the manufacturer. A good memory tester is built with features comparable with high-end ATE and medium range memory tester. The key is to provide a simple to use tester at an affordable price that is still effective in capturing most memory faults and failures.
Software testersedit
Memory diagnostic software programs (e.g., memtest86) are low-cost or free tools used to check for memory failures on a PC. They are usually in the form of a bootable software distribution on a floppy disk or CD-ROM. The diagnostic tools provide memory test patterns which are able to test all system memory in a computer. Diagnostic software cannot be used when a PC is unable to start due to memory or motherboard. While in principle a test program could report its results by sending them to a storage device (e.g., floppy disc) or printer if working, or by sound signals, in practice a working display is required.
Memory testers are designed to detect two types of faults that affect the functional behavior of a system (memory chip, logic chips or PCB board): Non-Permanent faults and Permanent faults.
Permanent faultsedit
Permanent faults affect the logic values in the system permanently, these faults are easier to detect using a memory tester. Examples include:
Incorrect connections between integrated circuits, boards, etc. (e.g. missing connections or shorts due to solder splashes or design fault)
Broken component or parts of components
Incorrect IC mask, (Manufacturing problem)
Functional design errors (logical function that had to be implemented, is designed incorrectly).
Defective storage cell
Non-permanent faultsedit
Non-Permanent faults occur at random moments. They affect a system's behavior for an unspecified period of time. The detection and localization of non-permanent faults are extremely difficult with a memory tester. Sometimes non-permanent faults will not affect the system's operation during testing.
There are two types of non-permanent faults: Transient fault and Intermittent fault.
Transient faults are hard to detect, and there are no well defined faults to detect. Errors in RAM introduced by transient faults are often called software errors, the following examples are possible factors that will contribute to transient faults:
^The Worm Memory Test(PDF). Vector Graphic. 2015-10-21. (PDF) from the original on 2019-05-15. Retrieved 2021-12-13. (3 pages) (NB. From a Vector Graphic 3 service manual.)
^Wilkinson, William "Bill" Albert (2003) [1996, 1984]. "The H89 Worm: Memory Testing the H89". Bill Wilkinson's Heath Company Page. from the original on 2021-12-13. Retrieved 2021-12-13.
^Steinman, Jan W. (1986). "III. Useful 68000 Routines and Techniques, 16. The Worm Memory Test" (PDF). Written at West Linn, Oregon, USA. Dr. Dobb's Toolbook of 68000 Programming. New York, USA: Brady Book / Prentice Hall Press / Simon & Schuster, Inc. pp. 341–350. ISBN0-13-216649-6. LCCN 86-25308. (PDF) from the original on 2021-12-13. Retrieved 2021-12-13. (1+5+10+1 pages)
January 01, 1970
memory, tester, this, article, needs, additional, citations, verification, please, help, improve, this, article, adding, citations, reliable, sources, unsourced, material, challenged, removed, find, sources, news, newspapers, books, scholar, jstor, 2020, learn. This article needs additional citations for verification Please help improve this article by adding citations to reliable sources Unsourced material may be challenged and removed Find sources Memory tester news newspapers books scholar JSTOR May 2020 Learn how and when to remove this message Memory testers are specialized test equipment used to test and verify memory modules Contents 1 Types 1 1 Hardware testers 1 2 Software testers 1 2 1 Worm memory tests 2 Detected faults 2 1 Permanent faults 2 2 Non permanent faults 3 See also 4 ReferencesTypes editMemory module testers can be broadly categorized into two types hardware memory testers and software diagnostic programs that run in a PC environment Hardware memory testers have more sophisticated and comprehensive test features built into the tester as compared to software diagnostic testing programs Software diagnostic does allow for detection of possible problems when memory modules are already installed on the computer system Hardware testers edit High end automatic test equipment ATE Class Memory testers are used by most OEM memory chip manufacturers such as Samsung Hyundai Micron etc They are typically priced starting at one million dollars per system This equipment must be operated by well trained semiconductor engineers ATE Class Memory testers are built with very complex test algorithms to detect memory faults during the final stages of memory chip packaging Mid range memory testers typically priced under 26 000 1 and are commonly found in memory module manufacturing assembly houses These testers are built to support mass volumes of memory module testing They are also used for detecting assembly faults caused by mis soldering and cross cell contamination after chips are assembled onto PCB or SIMM cards These memory testers are usually docked onto an automatic handling system for high volume production testing thus eliminating manual intervention by an operator Low end memory testers are usually relatively low cost ranging from 1000 3000 Their main features are portability ease of use and relatively small size They are typically used by the service industry especially by computer service technicians RMA departments memory reseller brokers and wholesalers for verifying and testing memory modules that fails in PC system or before going into PC Quality and features of this range of memory testers varies greatly depending on the manufacturer A good memory tester is built with features comparable with high end ATE and medium range memory tester The key is to provide a simple to use tester at an affordable price that is still effective in capturing most memory faults and failures Software testers edit Memory diagnostic software programs e g memtest86 are low cost or free tools used to check for memory failures on a PC They are usually in the form of a bootable software distribution on a floppy disk or CD ROM The diagnostic tools provide memory test patterns which are able to test all system memory in a computer Diagnostic software cannot be used when a PC is unable to start due to memory or motherboard While in principle a test program could report its results by sending them to a storage device e g floppy disc or printer if working or by sound signals in practice a working display is required Worm memory tests edit Some stronger memory tests capable of detecting subtle timing problems are implemented as self modifying dynamically self relocating and potentially self destructive memory worms called worm memory test or worm test 2 3 4 5 Detected faults editMemory testers are designed to detect two types of faults that affect the functional behavior of a system memory chip logic chips or PCB board Non Permanent faults and Permanent faults Permanent faults edit Permanent faults affect the logic values in the system permanently these faults are easier to detect using a memory tester Examples include Incorrect connections between integrated circuits boards etc e g missing connections or shorts due to solder splashes or design fault Broken component or parts of components Incorrect IC mask Manufacturing problem Functional design errors logical function that had to be implemented is designed incorrectly Defective storage cell Non permanent faults edit Non Permanent faults occur at random moments They affect a system s behavior for an unspecified period of time The detection and localization of non permanent faults are extremely difficult with a memory tester Sometimes non permanent faults will not affect the system s operation during testing There are two types of non permanent faults Transient fault and Intermittent fault Transient faults are hard to detect and there are no well defined faults to detect Errors in RAM introduced by transient faults are often called software errors the following examples are possible factors that will contribute to transient faults Cosmic ray UV light Alpha particle Dust Pollution Humidity Temperature Pressure Vibration Power supply fluctuations Electromagnetic interference Static electrical discharges Ground loops Intermittent faults are caused by non environmental conditions such as Loose connections Deteriorating or aging components Critical timing Resistance and capacitance variation Physical irregularities Noise noise disturbs signals in the system Row hammer susceptibilitySee also editmemtest86 Power on self test POST NOP slide Apple WormReferences edit Innoventions Ramcheck Advanced Memory Tester PCSTATS com www pcstats com The Worm Memory Test PDF Vector Graphic 2015 10 21 Archived PDF from the original on 2019 05 15 Retrieved 2021 12 13 3 pages NB From a Vector Graphic 3 service manual Wilkinson William Bill Albert 2003 1996 1984 The H89 Worm Memory Testing the H89 Bill Wilkinson s Heath Company Page Archived from the original on 2021 12 13 Retrieved 2021 12 13 Steinman Jan W 1986 09 01 Written at West Linn Oregon USA The Worm Memory Test The Right to Assemble TRTA Dr Dobb s Journal of Software Tools for the Professional Programmer 11 9 Redwood City California USA M amp T Publishing Inc The People s Computer Company 114 115 662 663 ISSN 1044 789X 119 ark 13960 t74v34p9p CODEN DDJOEB Retrieved 2021 12 13 1 2 pages Steinman Jan W 1986 III Useful 68000 Routines and Techniques 16 The Worm Memory Test PDF Written at West Linn Oregon USA Dr Dobb s Toolbook of 68000 Programming New York USA Brady Book Prentice Hall Press Simon amp Schuster Inc pp 341 350 ISBN 0 13 216649 6 LCCN 86 25308 Archived PDF from the original on 2021 12 13 Retrieved 2021 12 13 1 5 10 1 pages Retrieved from https en wikipedia org w index php title Memory tester amp oldid 1209884988 Software testers, wikipedia, wiki, book, books, library,
