Logic built-in self-test (or LBIST) is a form of built-in self-test (BIST) in which hardware and/or software is built into integrated circuits allowing them to test their own operation, as opposed to reliance on external automated test equipment.
The main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins, and thus unreachable by external automated test equipment. Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built-in self test or power-on self test of the finished product.
Disadvantagesedit
LBIST that requires additional circuitry (or read-only memory) increases the cost of the integrated circuit. LBIST that only requires temporary changes to programmable logic or rewritable memory avoids this extra cost, but requires more time to first program in the BIST and then to remove it and program in the final configuration. Another disadvantage of LBIST is the possibility that the on-chip testing hardware itself can fail; external automated test equipment tests the integrated circuit with known-good test circuitry.
Related technologiesedit
Other, related technologies are MBIST (a BIST optimized for testing internal memory) and ABIST (either a BIST optimized for testing arrays or a BIST that is optimized for testing analog circuitry). The two uses may be distinguished by considering whether the integrated circuit being tested has an internal array or analog functions.
"Embedded Processor Based Built-In Self-Test and Diagnosis". CiteSeerX10.1.1.94.3451. {{cite web}}: Missing or empty |url= (help)
Hardware Diagnostic Self Tests
BIST for Analog Weenies
January 01, 1970
logic, built, self, test, lbist, form, built, self, test, bist, which, hardware, software, built, into, integrated, circuits, allowing, them, test, their, operation, opposed, reliance, external, automated, test, equipment, contents, advantages, disadvantages, . Logic built in self test or LBIST is a form of built in self test BIST in which hardware and or software is built into integrated circuits allowing them to test their own operation as opposed to reliance on external automated test equipment Contents 1 Advantages 2 Disadvantages 3 Related technologies 4 See also 5 External linksAdvantages editThe main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins and thus unreachable by external automated test equipment Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built in self test or power on self test of the finished product Disadvantages editLBIST that requires additional circuitry or read only memory increases the cost of the integrated circuit LBIST that only requires temporary changes to programmable logic or rewritable memory avoids this extra cost but requires more time to first program in the BIST and then to remove it and program in the final configuration Another disadvantage of LBIST is the possibility that the on chip testing hardware itself can fail external automated test equipment tests the integrated circuit with known good test circuitry Related technologies editOther related technologies are MBIST a BIST optimized for testing internal memory and ABIST either a BIST optimized for testing arrays or a BIST that is optimized for testing analog circuitry The two uses may be distinguished by considering whether the integrated circuit being tested has an internal array or analog functions See also editBuilt in self test Built in test equipment Design for test Power on self testExternal links editBuilt in Self Test BIST Embedded Processor Based Built In Self Test and Diagnosis CiteSeerX 10 1 1 94 3451 a href Template Cite web html title Template Cite web cite web a Missing or empty url help Hardware Diagnostic Self Tests BIST for Analog Weenies Retrieved from https en wikipedia org w index php title Logic built in self test amp oldid 930289407, wikipedia, wiki, book, books, library,
